Verify: Key to the stable single-electron-memory operation

Technical Digest - International Electron Devices Meeting, IEDM

Volumn , Issue , 1997, Pages 171-174

  Ishii, Tomoyuki ^a   Yano, Kazuo ^a   Sano, Toshiaki ^a   Mine, Toshiyuki ^a   Murai, Fumio ^a   Seki, Koichi ^a  

^a HITACHI LTD   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

SINGLE ELECTRON MEMORY;

LSI CIRCUITS; NANOSTRUCTURED MATERIALS; SEMICONDUCTING SILICON;

SEMICONDUCTOR STORAGE;

EID: 84886448113     PISSN: 01631918     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (8)