Modeling of submicron Si-MOSFET's for microwave applications with unique extraction of small-signal characteristic parameters

Journal of the Korean Physical Society

Volumn 37, Issue 6, 2000, Pages 915-922

  Baek, K H ^a   Lim, G M ^a   Cho, S D ^a   Kim, Y C ^a   Kim, H C ^a   Kim, S K ^a   Kim, D J ^a   Kim, D M ^a  

^a Kookmin University   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0034347705     PISSN: 03744884     EISSN: None     Source Type: Journal    
DOI: 10.3938/jkps.37.915     Document Type: Article

References (13)

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