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Volumn 376, Issue 1-2, 2000, Pages 249-254
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Studies on the formation of microcrystalline silicon with PECVD under low and high working pressure
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Author keywords
[No Author keywords available]
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Indexed keywords
CRYSTALLINE MATERIALS;
FILM GROWTH;
FILM PREPARATION;
INTERFACES (MATERIALS);
PLASMA ENHANCED CHEMICAL VAPOR DEPOSITION;
SEMICONDUCTING SILICON;
MICROCRYSTALLINE SILICON FILMS;
SEMICONDUCTING FILMS;
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EID: 0034317086
PISSN: 00406090
EISSN: None
Source Type: Journal
DOI: 10.1016/S0040-6090(00)01210-4 Document Type: Article |
Times cited : (36)
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References (10)
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