메뉴 건너뛰기




Volumn 39, Issue 11, 2000, Pages 6196-6201

Spectroscopic ellipsometry studies on ultrathin hydrogenated amorphous silicon films prepared by thermal chemical vapor deposition

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS SILICON; CHEMICAL VAPOR DEPOSITION; ELLIPSOMETRY; HYDROGENATION; MORPHOLOGY; SPECTROSCOPIC ANALYSIS; ULTRATHIN FILMS;

EID: 0034316180     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.39.6196     Document Type: Article
Times cited : (6)

References (19)
  • 18
    • 0008472541 scopus 로고
    • ed. J. L. Pankove Springer, Heidelberg
    • G. D. Cody: Semiconductors and Semimetals, ed. J. L. Pankove (Springer, Heidelberg, 1984) Vol. 21, p. 70.
    • (1984) Semiconductors and Semimetals , vol.21 , pp. 70
    • Cody, G.D.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.