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Volumn 18, Issue 6, 2000, Pages 2722-2729

Enhancement in field emission of silicon microtips by bias-assisted carburization

Author keywords

[No Author keywords available]

Indexed keywords

CARBON; CHARACTERIZATION; DEPOSITION; ELECTRIC POTENTIAL; PLASMA ENHANCED CHEMICAL VAPOR DEPOSITION; SILICON;

EID: 0034314705     PISSN: 10711023     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.1320809     Document Type: Article
Times cited : (21)

References (41)
  • 16


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.