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Volumn 70, Issue 15, 1997, Pages 1995-1997

Characterization of electron emission from planar amorphous carbon thin films using in situ scanning electron microscopy

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0000763505     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.119078     Document Type: Article
Times cited : (61)

References (23)
  • 18
    • 0028742710 scopus 로고    scopus 로고
    • private communication
    • M. P. Siegal, T. A. Friedmann, S. R. Kurtz, D. R. Tallant, R. L. Simpson, F. Dominguez, and K. F. McCarty, in Novel Forms of Carbon II, edited by C. L. Renschler, D. Cox. J. Pouch, and Y. Achiba (Materials Research Society, Pittsburgh, 1994), Vol. 349, p. 507; J.C. Barbour (private communication).
    • Barbour, J.C.1
  • 20
    • 0029737267 scopus 로고    scopus 로고
    • edited by D. Dreifus, A. Collins, C. Beetz, T. Humphreys, K. Das. and P. Pehrsson Materials Research Society, Pittsburgh
    • C. H. Seager, T. A. Friedmann, and D. E. Bliss, in Diamond for Electronic Applications, edited by D. Dreifus, A. Collins, C. Beetz, T. Humphreys, K. Das. and P. Pehrsson (Materials Research Society, Pittsburgh, 1996), Vol. 416, p. 145,
    • (1996) Diamond for Electronic Applications , vol.416 , pp. 145
    • Seager, C.H.1    Friedmann, T.A.2    Bliss, D.E.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.