AC output conductance of SOI MOSFET's and impact on analog applications

IEEE Electron Device Letters

Volumn 18, Issue 2, 1997, Pages 36-38

  Sinitsky, Dennis ^a   Tu, Robert ^a   Liang, Chunlin ^b   Chan, Mansun ^a   Bokor, Jeffrey ^a   Hu, Chenming ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

^b INTEL CORPORATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CURRENT VOLTAGE CHARACTERISTICS; ELECTRIC RESISTANCE; LINEAR INTEGRATED CIRCUITS; MATHEMATICAL MODELS; OXIDATION; OXIDES; SEMICONDUCTOR DEVICE MANUFACTURE; SEMICONDUCTOR DEVICE MODELS; SEMICONDUCTOR DOPING; SILICON ON INSULATOR TECHNOLOGY; SILICON WAFERS;

ANALOG CIRCUITS; DRY OXIDATION;

MOSFET DEVICES;

EID: 0031076514     PISSN: 07413106     EISSN: None     Source Type: Journal    
DOI: 10.1109/55.553036     Document Type: Article

References (8)

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