Focusing properties of a novel dual-gate edge emitter

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 39, Issue 10, 2000, Pages 5800-5804

  Nicolaescu, Dan ^a   Filip, Valeriu ^b   Itoh, Junji ^a  

^a ELECTROTECHNICAL LABORATORY   (Japan)

^b UNIVERSITY OF BUCHAREST   (Romania)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; ELECTRODES; ELECTRON BEAMS; ELECTRON EMISSION; ELECTRON SOURCES; FIELD EMISSION DISPLAYS; FOCUSING; MICROELECTRONICS; VACUUM APPLICATIONS;

DEFLECTION PROPERTIES; EDGE EMITTER; SOFTWARE PACKAGE SIMION; VACUUM MICROELECTRONICS;

GATES (TRANSISTOR);

EID: 0034290669     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.39.5800     Document Type: Article

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