Fault simulation and modelling of microelectromechanical systems

Computing and Control Engineering Journal

Volumn 11, Issue 5, 2000, Pages 242-250

  Rosing, R ^a   Lechner, A ^a   Richardson, A ^a   Dorey, A ^a  

^a LANCASTER UNIVERSITY   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

BUILT-IN SELF TEST; CLOSED LOOP CONTROL SYSTEMS; COMPUTER SIMULATION; DATA REDUCTION; ELECTRIC FAULT LOCATION; SIMULATORS;

FAULT SIMULATION;

MICROELECTROMECHANICAL DEVICES;

EID: 0034289030     PISSN: 09563385     EISSN: None     Source Type: Journal    
DOI: 10.1049/cce:20000505     Document Type: Article

References (22)

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