An integrated diagnostic reconfiguration (IDR) technique for fault tolerant mixed signal microsystems

Proceedings of the IEEE International Conference on Electronics, Circuits, and Systems

Volumn 1, Issue , 1998, Pages 413-416

  Sharif, Erfaan ^a   Dorey, Tony ^a   Richardson, Andrew ^a  

^a LANCASTER UNIVERSITY   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

APPLICATION SPECIFIC INTEGRATED CIRCUITS; ELECTRIC SIGNAL SYSTEMS; SIGNAL SYSTEMS; ALGORITHMS; BUILT-IN SELF TEST; EMBEDDED SYSTEMS; INTEGRATED CIRCUIT TESTING; MICROCONTROLLERS; REDUCED INSTRUCTION SET COMPUTING;

AUTOMOTIVE APPLICATIONS; INTEGRATED DIAGNOSTICS; MIXED-SIGNAL SYSTEMS; PIEZO-RESISTIVE; REDUNDANT DEVICES; SENSOR INTERFACE CIRCUITS; SILICON PRESSURE SENSORS; SOFTWARE MODULES;

MIXED SIGNAL INTEGRATED CIRCUITS; APPLICATION SPECIFIC INTEGRATED CIRCUITS;

INTEGRATED DIAGNOSTIC RECONFIGURATION (IDR); UNIVERSAL SENSOR INTERFACE CIRCUIT (USIC);

EID: 0032265040     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ICECS.1998.813352     Document Type: Conference Paper

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