A fault simulation methodology for MEMS

Proceedings -Design, Automation and Test in Europe, DATE

Volumn , Issue , 2000, Pages 476-483

  Rosing, R ^a   Richardson, A M ^a   Dorey, A P ^a  

^a LANCASTER UNIVERSITY   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

DESIGN FLOWS; FAULT COVERAGES; FAULT SIMULATION; HIGH RELIABILITY AND SAFETIES; MICRO ELECTROMECHANICAL SYSTEM (MEMS); MIXED-SIGNAL ASIC; TEST STRATEGIES; TOOLS AND TECHNIQUES;

ELECTROMECHANICAL DEVICES; EXHIBITIONS; MEMS;

DESIGN;

EID: 0001910203     PISSN: 15301591     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/DATE.2000.840828     Document Type: Conference Paper

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