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Volumn 48, Issue 14, 2000, Pages 3641-3645
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Roughness effect on the measurement of interface stress
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Author keywords
[No Author keywords available]
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Indexed keywords
GRAIN BOUNDARIES;
STRESS ANALYSIS;
SURFACE ROUGHNESS;
INTERFACE STRESS;
THIN FILMS;
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EID: 0034276109
PISSN: 13596454
EISSN: None
Source Type: Journal
DOI: 10.1016/S1359-6454(00)00170-1 Document Type: Article |
Times cited : (14)
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References (29)
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