Quantitative study of interface roughness replication in multilayers using x-ray reflectivity and transmission electron microscopy

Applied Physics Letters

Volumn 69, Issue 9, 1996, Pages 1318-1320

  Chladek M ^a   Valvoda, V ^a   Dorner, C ^b   Holy C ^c   Grim, J ^c  

^a CHARLES UNIVERSITY   (Czech Republic)

^b UNIVERSITY OF REGENSBURG   (Germany)

^c MASARYK UNIVERSITY   (Czech Republic)

Author keywords

[No Author keywords available]

Indexed keywords

APPROXIMATION THEORY; CORRELATION METHODS; GOLD; INTERFACES (MATERIALS); METALLIC FILMS; MULTILAYERS; NICKEL ALLOYS; THICKNESS MEASUREMENT; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION;

CORRELATION LENGTH; DISTORTED WAVE BORN APPROXIMATION; MAGNETIC MULTILAYERS; NICKEL COBALT ALLOYS; X RAY REFLECTIVITY;

SURFACE ROUGHNESS;

EID: 0030215442     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.117580     Document Type: Article

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