Surface sensitivity effects with local probe scanning Auger-scanning electron microscopy

Applied Physics Letters

Volumn 75, Issue 8, 1999, Pages 1080-1082

  Van Agterveld, D T L ^a   Palasantzas, G ^a   De Hosson, J Th M ^a  

^a UNIVERSITY OF GRONINGEN   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0038168005     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.124603     Document Type: Article

References (11)

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2. M. P. Seah and C. Lea, Thin Solid Films 81, 257 (1981).
3. See, for example, see JAMP 7800 F Scanning Auger and Electron Microscope (JEOL, Tokyo, Japan).
4. J. Aué and J. Th. M. De Hosson, Appl. Phys. Lett. 71, 1347 (1997); J. Krim and G. Palasantzas, Int. J. Mod. Phys. B 9, 599 (1995); P. Meakin, Phys. Rep. 235, 1991 (1993); H.-N. Yang, T.-M. Lu, and G.-C. Wang, Diffraction from Rough Surfaces and Dynamic Growth Fronts (World Scientific, Singapore, 1993).
5. J. Aué and J. Th. M. De Hosson, Appl. Phys. Lett. 71, 1347 (1997); J. Krim and G. Palasantzas, Int. J. Mod. Phys. B 9, 599 (1995); P. Meakin, Phys. Rep. 235, 1991 (1993); H.-N. Yang, T.-M. Lu, and G.-C. Wang, Diffraction from Rough Surfaces and Dynamic Growth Fronts (World Scientific, Singapore, 1993).
6. J. Aué and J. Th. M. De Hosson, Appl. Phys. Lett. 71, 1347 (1997); J. Krim and G. Palasantzas, Int. J. Mod. Phys. B 9, 599 (1995); P. Meakin, Phys. Rep. 235, 1991 (1993); H.-N. Yang, T.-M. Lu, and G.-C. Wang, Diffraction from Rough Surfaces and Dynamic Growth Fronts (World Scientific, Singapore, 1993).
7. J. Aué and J. Th. M. De Hosson, Appl. Phys. Lett. 71, 1347 (1997); J. Krim and G. Palasantzas, Int. J. Mod. Phys. B 9, 599 (1995); P. Meakin, Phys. Rep. 235, 1991 (1993); H.-N. Yang, T.-M. Lu, and G.-C. Wang, Diffraction from Rough Surfaces and Dynamic Growth Fronts (World Scientific, Singapore, 1993).
8. See, for example, P. Herrasti, P. Ocon, P. Vazquez, R. C. Salvarezza, J. M. Vara, and A. J. Avria, Phys. Rev. A 45, 7440 (1992); R. C. Salvarezza, P. Vazquez, P. Herrasti, P. Ocon, J. M. Vara, and A. J. Avria, Europhys. Lett. 20, 727 (1992).
9. See, for example, P. Herrasti, P. Ocon, P. Vazquez, R. C. Salvarezza, J. M. Vara, and A. J. Avria, Phys. Rev. A 45, 7440 (1992); R. C. Salvarezza, P. Vazquez, P. Herrasti, P. Ocon, J. M. Vara, and A. J. Avria, Europhys. Lett. 20, 727 (1992).
10. G. Palasantzas and J. Krim, Phys. Rev. Lett. 73, 3564 (1994).
11. Y.-P. Zhao, H.-N. Yang, G.-C. Wang, and T.-M. Lu, Phys. Rev. B 57, 1922 (1998).