Four generations of high-voltage electron microscopes

Journal of Electron Microscopy

Volumn 48, Issue 4, 1999, Pages 301-315

  Seeger, Alfred ^a  

^a UNIVERSITY OF STUTTGART   (Germany)

Author keywords

Critical voltages; Electron diffraction; Graphite diamond transformation; High resolution microscopy; High voltage electron microscopes; Irradiation damage; Self organization

Indexed keywords

ATOMS; CYTOLOGY; DIAMONDS; ELECTRON IRRADIATION; ELECTRON MICROSCOPES; ENERGY TRANSFER; GRAPHITE; STACKING FAULTS; THERMODYNAMICS;

CRITICAL VOLTAGES; GRAPHITE-DIAMOND TRANSFORMATION; HIGH VOLTAGE ELECTRON MICROSCOPE; HIGH VOLTAGE ELECTRON MICROSCOPY; HIGH-RESOLUTION MICROSCOPY; IN-SITU EXPERIMENTS; IRRADIATION DAMAGE; MATERIAL SCIENCE; OPERATING VOLTAGE; SELF ORGANIZATIONS;

ELECTRONS;

EID: 0032879198     PISSN: 00220744     EISSN: None     Source Type: Journal    
DOI: 10.1093/oxfordjournals.jmicro.a023682     Document Type: Review

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