메뉴 건너뛰기




Volumn 22, Issue 3, 1997, Pages 30-35

SiC-seeded crystal growth

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL DEFECTS; CRYSTAL GROWTH; CRYSTAL STRUCTURE; CURRENT VOLTAGE CHARACTERISTICS; DISLOCATIONS (CRYSTALS); MESFET DEVICES; SEMICONDUCTOR DEVICE MANUFACTURE; SEMICONDUCTOR DOPING; SILICON WAFERS; SUBLIMATION; TRANSPORT PROPERTIES; VAPOR DEPOSITION;

EID: 0031098060     PISSN: 08837694     EISSN: None     Source Type: Journal    
DOI: 10.1557/S0883769400032735     Document Type: Article
Times cited : (64)

References (13)
  • 1
    • 85033177622 scopus 로고    scopus 로고
    • An efficient search of the latest work from these groups is accomplished by reading chapter 1
    • Institute of Physics Conference Series No. 142, Bristol
    • An efficient search of the latest work from these groups is accomplished by reading chapter 1 in Proc. 6th Int. Conf. SiC Related Mater. 1995, edited by S. Nakashima, H. Matsunami, S. Yoshida, and H. Harima (Institute of Physics Conference Series No. 142, Bristol, 1996) p. 1.
    • (1996) Proc. 6th Int. Conf. SiC Related Mater. 1995 , pp. 1
    • Nakashima, S.1    Matsunami, H.2    Yoshida, S.3    Harima, H.4
  • 9
    • 85033169363 scopus 로고    scopus 로고
    • edited by S. Nakashima, H. Matsunami, S. Yoshida, and H. Harima Institute of Physics Conference Series No. 142, Bristol
    • N. Takanaka, S. Nishino, and J. Saraie, in Proc. 6th Int. Conf. SiC Related Mater., edited by S. Nakashima, H. Matsunami, S. Yoshida, and H. Harima (Institute of Physics Conference Series No. 142, Bristol, 1996) p. 813.
    • (1996) Proc. 6th Int. Conf. SiC Related Mater. , pp. 813
    • Takanaka, N.1    Nishino, S.2    Saraie, J.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.