SCOPUS 정보 검색 플랫폼

Volumn 9, Issue 8, 2000, Pages 1500-1505

Raman spectroscopy measurements of DC-magnetron sputtered carbon nitride (a-C:N) thin films for magnetic hard disk coatings

(5) Neuhaeuser, M a Hilgers, H a Joeris, P a White, R b Windeln, J a

a IBM (Germany)

b IBM (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ADHESION; AUGER ELECTRON SPECTROSCOPY; DURABILITY; ELLIPSOMETRY; HARD DISK STORAGE; MAGNETRON SPUTTERING; NITRIDES; RAMAN SPECTROSCOPY; SECONDARY ION MASS SPECTROMETRY; SPUTTER DEPOSITION; THIN FILMS; WEAR RESISTANCE;

CARBON NITRIDE THIN FILMS;

AMORPHOUS FILMS;

CARBONITRIDING; CORROSION RESISTANCE; DIAMOND COATING; DIAMOND-LIKE CARBON; FILM; TRIBOLOGY;

EID: 0034253495 PISSN: 09259635 EISSN: None Source Type: Journal
DOI: 10.1016/S0925-9635(00)00276-4 Document Type: Article

Times cited : (68)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.