Trap creation in ultrathin SiO2 films due to electron injection studied by scanning tunneling microscopy/scanning tunneling spectroscopy

Applied Surface Science

Volumn 162, Issue , 2000, Pages 395-400

  Ohmori, Kenji ^a   Zaima, Shigeaki ^a   Yasuda, Yukio ^a  

^a NAGOYA UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

DIELECTRIC FILMS; ELECTRONIC DENSITY OF STATES; SCANNING TUNNELING MICROSCOPY; SPECTROSCOPIC ANALYSIS; ULTRATHIN FILMS;

SCANNING TUNNELING SPECTROSCOPY; TRAP CREATION;

SILICA;

EID: 0034250284     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(00)00222-1     Document Type: Article

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