Cellular automata-based test pattern generators with phase shifters

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

Volumn 19, Issue 8, 2000, Pages 878-893

  Mrugalski, Grzegorz ^a   Rajski, Janusz ^a   Tyszer, Jerzy ^a  

^a POZNAN UNIVERSITY OF TECHNOLOGY   (Poland)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; BOUNDARY CONDITIONS; BUILT-IN SELF TEST; CELLULAR ARRAYS; COMPUTER SIMULATION; ELECTRIC GENERATORS; FINITE AUTOMATA; MATRIX ALGEBRA; PHASE SHIFTERS; POLYNOMIALS;

CIRCUIT COMPLEXITY; LINEAR FINITE STATE MACHINE; ONE DIMENSIONAL LINEAR HYBRID CELLULAR AUTOMATA; SYSTEM ON A CHIP TEST; TEST PATTERN GENERATOR;

INTEGRATED CIRCUIT LAYOUT;

EID: 0034247745     PISSN: 02780070     EISSN: None     Source Type: Journal    
DOI: 10.1109/43.856975     Document Type: Article

References (23)

1. P.H. Bardell, "Analysis of cellular automata used as pseudorandom pattern generators," in Proc. Int. Test Conf., 1990, pp. 762-767'.
2. _, "Design considerations for parallel pattern generators," J. Electron. Testing: Theory Applicat., no. 1, pp. 73-87, 1990.
3. P.H. Bardell, W. H. McAnney, and J. Savir, Built-in Test for VLSI: Pseudorandom Techniques. New York: Wiley, 1987.
4. K. Cattell and J.C. Muzio, "Synthesis of one-dimensional linear hybrid cellular automata," IEEE Trans. Computer-Aided Design, vol. 15, pp. 325-335, Mar. 1996.
5. K. Cattell, S. Zhang, M. Serra, and J.C. Muzio, "2-by-n hybrid cellular automata with regular configuration: Theory and application," IEEE Trans. Comput., vol. 48, pp. 285-295, Mar. 1999.
6. S. Chattopadhyay, D.R. Chowdhury, S. Bhattacharjee, and P. P. Chaudhuri, "Cellular-automata-array-based diagnosis of board level faults," IEEE Trans. Comput.. vol. 47, pp. 817-828, Aug. 1998.
7. P.P. Chaudhuri, D. R. Chowdhury, S. Nandi, and S. Chattopadhyay, Additive Cellular Automata: Theory and Applications. Los Alamitos, CA: IEEE Comput. Soc. Press, 1997, vol. 1.
8. D.R. Chowdhury, I. Sengupta, and P. P. Chaudhuri, "A class of twodimensional cellular automata and their applications in random testing," J. Electron. Testing: Theory Applicat., vol. 5, no. 1, pp. 67-82, 1994.
9. A.K. Das and P. P. Chaudhuri, "Vector space theoretic analysis of additive cellular automata and its applications for pseudoexhaustive test pattern generation," IEEE Trans. Comput., vol. 42, pp. 340-352, Mar. 1993.
10. S.W. Golomb, Shift Register Sequences. San Francisco, CA: Holden Day, 1967.
11. P.D. Hortensius, R. D. McLeod, W. Pries, D. M. Miller, and H. C. Card, "Cellular automata-based pseudorandom number generators for built-in self-test," IEEE Trans. Computer-Aided Design, vol. 8, pp. 842-859, Aug. 1989.
12. B. Ireland and J.E. Marshall, "Matrix method to determine shift-register connections for delayed pseudorandom binary sequences," Electron. Lett., vol. 4, no. 15, pp. 309-310, 1968.
13. K.J. Latawiec, "New method of generation of shifted linear pseudorandom binary sequences," Proc. Inst. Etectr. Eng., vol. 121, no. 8, pp. 905-906, 1974.
14. J. Li, X. Sun, and K. Soon, "Tree-structured linear cellular automata and their applications as PRPGs,"in Proc. Int. Test Conf., 1997, pp. 858-867.
15. [ 15] G. Mrugalski, J. Rajski, and J. Tyszer, "Comparative study of CA-based PRPGs and LFSRs with phase shifters," in Proc. VLSI Test Symp., 1999, pp. 236-245.
16. W. Pries, A. Thanailakis, and H.C. Card, "Group properties of cellular automata and VLSI applications," IEEE Trans. Comput., vol. C-35, pp. 1013-1024, Dec. 1986.
17. J. RajskiandJ. Tyszer, "Design of phase shifters for BIST applications," in VLSI Test Symp., 1998, pp. 218-224.
18. J. Rajski, N. Tamarapalli, and J. Tyszer, "Automated synthesis of large phase shifters for built-in self-test," in Proc. Int. Test Conf., 1998, pp. 1047-1056.
19. J. Rajski and J. Vasudevamurthy, "The testability-preserving concurrent decomposition and factorization of Boolean expressions," IEEE Trans. Computer-Aided Design, vol. 11, pp. 778-793, June 1992.
20. M. Serra, T. Slater, J.C. Muzio, and D. M. Miller, "The analysis of one-dimensional linear cellular automata and their aliasing properties," IEEE Trans. Computer-Aided Design, vol. 9, pp. 767-778, July 1990.
21. P. Tsalides, "Cellular automata based built-in self-test structures for VLSI systems," Electron. Lett., vol. 26, no. 17, pp. 1350-1352, 1990.
22. S. Wolfram, "Statistical mechanics of cellular automata," Rev. Modern Phys., vol. 55, no. 3, pp. 601-644, 1983.
23. S. Zhang, R. Byrne, J.C. Muzio, and D. M. Miller, "Quantitative analysis for linear hybrid cellular automata and LFSR as built-in self-test generators for sequential faults," J. Electron. Testing: Theory Applicat., vol. 7, no. 3, pp. 209-221, 1995.