Cellular Automata-Based Built-in Self-Test Structures for Vlsi Systems

Electronics Letters

Volumn 26, Issue 17, 1990, Pages 1350-1352

  Tsalides, P H ^a  

^a DEMOCRITUS UNIVERSITY OF THRACE   (Greece)

Author keywords

Large scale integration; Pseudorandom number generation; Self testing devices

Indexed keywords

AUTOMATA THEORY;

BUILT-IN SELF-TEST; CELLULAR AUTOMATA; DESIGN FOR TESTABILITY; PSEUDORANDOM NUMBER GENERATION; SELF-TESTING DEVICES; TEST PATTERN GENERATION;

INTEGRATED CIRCUITS, VLSI;

EID: 0025469520     PISSN: 00135194     EISSN: None     Source Type: Journal    
DOI: 10.1049/el:19900869     Document Type: Article

References (10)

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9. Pitsianis, N., Tsalides, P.H., Bleris, G. L., Thanailakis, A., and Card, H. C.: ‘Algebraic theory of bounded one-dimensional cellular automata’, Complex Syst., 1989, 3, (2), pp. 209–227
10. Gill, A. (Ed.): ‘Linear sequential circuits: analysis, synthesis and applications’ (McGraw-Hill, New York, USA, 1967)