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Volumn 7, Issue 3, 1995, Pages 209-221

Quantitative analysis for linear hybrid cellular automata and LFSR as built-in self-test generators for sequential faults

Author keywords

built in self test; linear feedback shift register; linear finite state machine; linear hybrid cellular automata; sequential fault; transition capability

Indexed keywords

COMBINATORIAL CIRCUITS; COMPUTER SIMULATION; DELAY CIRCUITS; FAILURE ANALYSIS; FINITE AUTOMATA; POLYNOMIALS; SHIFT REGISTERS; VECTORS;

EID: 0029492743     PISSN: 09238174     EISSN: 15730727     Source Type: Journal    
DOI: 10.1007/BF00995314     Document Type: Article
Times cited : (12)

References (19)
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    • 84935479551 scopus 로고    scopus 로고
    • P.H. Bardell, W.H. McAnney, and J. Savir, Built-In Test for VLSI: Pseudorandom Techniques, John Wiley and Sons, 1987.
  • 3
    • 84935487029 scopus 로고    scopus 로고
    • S. Zhang, R. Byrne, and D.M. Miller, “BIST Generators for Sequential Faults,”Proceedings of IEEE International Conference on Computer Design, October 1992, pp. 260–263.
  • 4
    • 84935452028 scopus 로고    scopus 로고
    • K. Furuya and E.J. McCluskey, “Two-Pattern Test Capabilities of Autonomous TPG Circuits,”Proceedings of IEEE International Test Conference, 1991, pp. 704–711.
  • 6
    • 84935445461 scopus 로고    scopus 로고
    • H.S. Stone, Discrete Mathematics Structures and Their Applications, Science Research Associates Inc., 1973.
  • 9
    • 84935510860 scopus 로고    scopus 로고
    • K. Cattell and J. C. Muzio, “A Linear Cellular Automata Algorithm: Algorithm Summary,”Proceedings of the 5th Technical Workshop on New Directions for 1C Testing, August 1991.
  • 14
    • 84935438959 scopus 로고    scopus 로고
    • T.H. Cormen, C.E. Leiserson, and R.L. Rivest, Introduction to Algorithms, The MIT Press, 1990.
  • 15
    • 84935426822 scopus 로고    scopus 로고
    • F. Brglez and H. Fujiwara, “A Neutral Netlist of 10 Combinational Benchmark Circuits and a Target Translator in FORTRAN.”Proceedings of IEEE Interantional Symposium on Circuits and Systems, 1985, pp. 663–698.
  • 16
    • 84935483932 scopus 로고    scopus 로고
    • J.A. Waicukauski, E. Lindbloom, B.K. Rosen, and V.S. Iyengar, “Transition Fault Simulation,”IEEE Design and Test of Computers, April 1987, pp. 32–38.
  • 17
    • 84935479544 scopus 로고    scopus 로고
    • G. Tromp and A.J. van de Goor, “Logic Synthesis of 100-Percent Testable Logic Networks,”Proceedings of IEEE International Conference on Computer Design, 1991, pp. 428–431.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.