SEM based estimation of the grain boundary plane orientation in zinc oxide varistors using conductive mode microscopy

Scripta Materialia

Volumn 43, Issue 6, 2000, Pages 529-534

  Leach, C ^a  

^a UNIVERSITY OF MANCHESTER   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

BAND STRUCTURE; CRYSTAL ORIENTATION; CRYSTALLOGRAPHY; ELECTRIC FIELD EFFECTS; ELECTRODES; ELECTRONIC DENSITY OF STATES; GRAIN BOUNDARIES; INTERFACES (MATERIALS); PERMITTIVITY; POLYCRYSTALLINE MATERIALS; SCANNING ELECTRON MICROSCOPY; VARISTORS;

CONDUCTIVE MODE MICROSCOPY; ELECTROCERAMICS; REMOTE ELECTRON BEAM INDUCED CURRENT MICROSCOPY;

ZINC OXIDE;

EID: 0034245259     PISSN: 13596462     EISSN: None     Source Type: Journal    
DOI: 10.1016/S1359-6462(00)00463-2     Document Type: Article

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