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Volumn 81, Issue 7, 1998, Pages 1961-1963

Direct observation of the double Schottky barrier in niobium-doped barium titanate by the charge-collection current method

Author keywords

[No Author keywords available]

Indexed keywords

BARIUM TITANATE; DOPING (ADDITIVES); ELECTRIC CONDUCTIVITY OF SOLIDS; ELECTRIC CURRENT MEASUREMENT; GRAIN BOUNDARIES; NIOBIUM;

EID: 0032118604     PISSN: 00027820     EISSN: None     Source Type: Journal    
DOI: 10.1111/j.1151-2916.1998.tb02576.x     Document Type: Article
Times cited : (28)

References (12)
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  • 3
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    • Electrical Conduction Anomaly in Samarium-Doped Barium Titanate
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  • 4
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    • Resistivity Anomaly in Doped Barium Titanate
    • W. Heywang, "Resistivity Anomaly in Doped Barium Titanate," J. Am. Ceram. Soc., 47 [10] 484-90 (1964).
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    • Heywang, W.1
  • 5
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    • Eine Methode zum Direkten Nachweis von Leitfahigkeitsinhomogenitaten an Korngrenzen
    • P. Gerthsen and K. H. Härdtl, "Eine Methode zum Direkten Nachweis von Leitfahigkeitsinhomogenitaten an Korngrenzen," Z. Naturforsch., A18, 423-24 (1963).
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    • Gerthsen, P.1    Härdtl, K.H.2
  • 6
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    • H. Rehme "Imaging Electric Microfields in the Emission Electron Microscope," Z. Angew. Phys., 29 [3] 173-80 (1970).
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    • Rehme, H.1
  • 7
    • 0007132258 scopus 로고
    • 3 Ceramics by Cathodeluminescence in an Electron-Probe Microanalyzer
    • 3 Ceramics by Cathodeluminescence in an Electron-Probe Microanalyzer," Appl. Phys. Lett., 35 [4] 307-309 (1979).
    • (1979) Appl. Phys. Lett. , vol.35 , Issue.4 , pp. 307-309
    • Ihrig, H.1
  • 8
    • 11644308996 scopus 로고
    • Surface Barrier and p-n Junction Diodes
    • Edited by P. W. Hawkes. Springer-Verlag, Berlin, Germany
    • L. Reimer, "Surface Barrier and p-n Junction Diodes"; pp. 186-90 in Springer Series in Optical Sciences, Vol. 45, Scanning Electron Microscopy. Edited by P. W. Hawkes. Springer-Verlag, Berlin, Germany, 1985.
    • (1985) Springer Series in Optical Sciences, Vol. 45, Scanning Electron Microscopy , vol.45 , pp. 186-190
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  • 9
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    • Direct Measurement of the Local Diffusion Length Grain Boundaries by EBIC without Schottky Contact
    • J. Phys. IV, Colloq. C6
    • J. Palm and H. Alexander, "Direct Measurement of the Local Diffusion Length Grain Boundaries by EBIC without Schottky Contact," J. Phys. IV, Colloq. C6, supplement to J. Phys. III, 1, 101-106 (1991).
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    • Direct Observation of Grain Boundary Schottky Barrier Behaviour in Zinc Oxide Material
    • J. D. Russel, D. C. Halls, and C. Learch, "Direct Observation of Grain Boundary Schottky Barrier Behaviour in Zinc Oxide Material," J. Mater. Sci. Lett., 14, 676-78 (1995).
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.