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P. Ciampolini, M. Baroncini, A. Santocchia, G.M. Bilei, B. Checcucci, E. Fiandrini, Comprehensive Modeling of Silicon Microstrip Detectors, IEEE Trans. on Nucl. Sc., Vol.
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D. Passeri, M. Baroncini, P. Ciampolini, G.M. Bilei, A. Santocchia, B. Checcucci, E. Fiandrini, TCAD-Based Analysis of Radiation-Hardness in Silicon Detectors, IEEE Trans. on Nucl. Sc., vol. 45, n. 3, 1998.
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M. Baroncini, P. Ciampolini, G.M. Bilei, A. Santocchia, B. Checcucci, E. Fiandrini, TCAD-Based Analysis of Radiation-Hardness in Silicon Detectors, IEEE Trans. on Nucl. Sc., Vol.
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E. Fretwurst, V. Eremin, H. Feick, J. Gerhardt, Z. Li, G. Lindstrom, Investigation of damage-induced defects in silicon by TCT, Nucl. Instr. and Meth., vol. A388, pp. 356-360, 1997
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D. Passeri, P. Ciampolini, G.M. Bilei, G. Casse, F. Lemeilleur, Analysis of the transient response of LED-illuminated diodes under heavy radiation damage, Proc. of 1st ENDEASD Workshop, Santorini, Greece, April 21-22 1999.
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P. Ciampolini, G.M. Bilei, G. Casse, F. Lemeilleur, Analysis of the Transient Response of LED-illuminated Diodes under Heavy Radiation Damage, Proc. of
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2nd Int. Conf. on Radiation Effects on Semiconductor Materials, Detectors and Devices, Florence (Italy), March 4-6, 1998.
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G.Casse, E. Grigoriev, F Lemeilleur, M. Glaser, Study of the active volume in irradiated silicon detectors, Proc. of 2nd Int. Conf. on Radiation Effects on Semiconductor Materials, Detectors and Devices, Florence (Italy), March 4-6, 1998.
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E. Grigoriev, F Lemeilleur, M. Glaser, Study of the Active Volume in Irradiated Silicon Detectors, Proc. of
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426, no. 1, pp. 131-134, 1999.
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D. Passeri, P. Ciampolini, G.M. Bilei, A CAD investigation of depletion mechanisms in irradiated silicon microstrip detectors, Nuclear Instruments and Methods in Physics Research, vol. A 426, no. 1, pp. 131-134, 1999.
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P. Ciampolini, G.M. Bilei, A CAD Investigation of Depletion Mechanisms in Irradiated Silicon Microstrip Detectors, Nuclear Instruments and Methods in Physics Research, Vol. a
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