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Volumn 47, Issue 4 PART 1, 2000, Pages 1468-1473

Physical modeling of silicon microstrip detectors: influence of the electrode geometry on critical electric fields

Author keywords

[No Author keywords available]

Indexed keywords

MICRO-DISCHARGES; SILICON MICROSTRIP DETECTORS;

EID: 0034245104     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/23.872998     Document Type: Article
Times cited : (19)

References (12)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.