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Volumn 3, Issue 4, 2000, Pages 243-249

Defect kinetics in novel detector materials

Author keywords

[No Author keywords available]

Indexed keywords

COLLIDING BEAM ACCELERATORS; CRYSTAL DEFECTS; CRYSTAL IMPURITIES; HARDNESS; RADIATION DAMAGE; REACTION KINETICS; SEMICONDUCTING SILICON;

EID: 0034240731     PISSN: 13698001     EISSN: None     Source Type: Journal    
DOI: 10.1016/S1369-8001(00)00039-1     Document Type: Article
Times cited : (13)

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