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The reported film growth rate G should be increased by a factor of 4/2.6=1.54. Film growth was measured with interference fringes; each represents a thickness increase of λ/2 n, where n is the film index of refraction. This correction results from reducing n to 2.6 from the originally assumed value of 4.0. The 4.0 value is typical for films deposited at 240 C, whereas we recently measured 2.6 for films deposited at 22 C, as in Ref. 3
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