Motion of atomic steps on ultraflat Si(111): Constructive collisions

Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films

Volumn 18, Issue 4 II, 2000, Pages 1941-1945

  Finnie, P ^a   Homma, Y ^a  

^a Kashino Diverse Brain Research Laboratory of NTT Communication Science Laboratories   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

HIGH TEMPERATURE EFFECTS; SCANNING ELECTRON MICROSCOPY; SUBSTRATES;

COLLISION DYNAMICS;

SEMICONDUCTING SILICON;

EID: 0034230195     PISSN: 07342101     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.582450     Document Type: Article

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