Prerequisites for high-quality magnetic tunnel junctions: XPS and NMR study of Co/Al bilayers

Applied Physics A: Materials Science and Processing

Volumn 70, Issue 4, 2000, Pages 435-441

  De Gronckel, H A M ^a,b   Kohlstedt, H ^a   Daniels, C ^a  

^a FORSCHUNGSZENTRUM JÜLICH   (Germany)

^b NONE   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM; COBALT; DEPOSITION; FERROMAGNETIC MATERIALS; METALLIC FILMS; NICKEL ALLOYS; NIOBIUM; NUCLEAR MAGNETIC RESONANCE; SURFACE PROPERTIES; TUNNEL JUNCTIONS; X RAY PHOTOELECTRON SPECTROSCOPY;

BILAYERS; HIGH QUALITY MAGNETIC TUNNEL JUNCTIONS; X RAY PHOTOEMISSION SPECTROSCOPY;

MULTILAYERS;

EID: 0034172070     PISSN: 09478396     EISSN: None     Source Type: Journal    
DOI: 10.1007/s003390051063     Document Type: Article

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