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Journal of Materials Research

Volumn 15, Issue 3, 2000, Pages 764-771

Thermal transport through thin films: Mirage technique measurements on aluminum/titanium multilayers

(5) Gonzalez, E J a Bonevich, J E a Stafford, G R a White, G a Josell, D a

a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM; ELECTRIC CONDUCTANCE; ENERGY DISPERSIVE SPECTROSCOPY; MULTILAYERS; SEMICONDUCTING SILICON; SUBSTRATES; THERMAL DIFFUSION; TITANIUM; TRANSPORT PROPERTIES;

THERMAL TRANSPORT;

THIN FILMS;

EID: 0034160220 PISSN: 08842914 EISSN: None Source Type: Journal
DOI: 10.1557/JMR.2000.0110 Document Type: Article

Times cited : (18)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.