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Volumn 14, Issue 5, 1999, Pages 1977-1981

Face-centered-cubic titanium: an artifact in titanium/aluminum multilayers

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM; CRYSTAL STRUCTURE; ELECTRON DIFFRACTION; METALLIC FILMS; TITANIUM; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION ANALYSIS;

EID: 0032674738     PISSN: 08842914     EISSN: None     Source Type: Journal    
DOI: 10.1557/JMR.1999.0266     Document Type: Article
Times cited : (27)

References (13)
  • 6
    • 0027797043 scopus 로고
    • Thin Films: Stresses and Mechanical Properties IV, edited by P. H. Townsend, T. P. Weihs, J. E. Sanchez, Jr., and P. Børgesen Pittsburgh, PA
    • J. Chaudhuri, S. M. Alyan, and A. F. Jankowski, in Thin Films: Stresses and Mechanical Properties IV, edited by P. H. Townsend, T. P. Weihs, J. E. Sanchez, Jr., and P. Børgesen (Mater. Res. Soc. Symp. Proc. 308, Pittsburgh, PA, 1993), p. 707.
    • (1993) Mater. Res. Soc. Symp. Proc. , vol.308 , pp. 707
    • Chaudhuri, J.1    Alyan, S.M.2    Jankowski, A.F.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.