-
1
-
-
0040115139
-
Thermal, mechanical and environmental durability design methodologies, chapter packaging
-
E. Suhir, Y.C. Lee, Thermal, mechanical and environmental durability design methodologies, chapter packaging in Electronic Materials Handbook, vol 1., 1988.
-
(1988)
In Electronic Materials Handbook
, vol.1
-
-
Suhir, E.1
Lee, Y.C.2
-
2
-
-
0031166703
-
Thermal stresses in layered electronic assemblies
-
Jiang Z.Q., Huang Y., Chandra A. Thermal stresses in layered electronic assemblies. J. Electron. Pack. 119:1997;127-133.
-
(1997)
J. Electron. Pack.
, vol.119
, pp. 127-133
-
-
Jiang, Z.Q.1
Huang, Y.2
Chandra, A.3
-
4
-
-
0040565734
-
Thermal stresses in compliantly-joined materials
-
Paper No. 89-WA/EEP-14, San Francisco, CA, December
-
J.C. Glaser, Thermal stresses in compliantly-joined materials, ASME Winter Annual Meeting, Paper No. 89-WA/EEP-14, San Francisco, CA, December 1989.
-
(1989)
ASME Winter Annual Meeting
-
-
Glaser, J.C.1
-
5
-
-
0001764380
-
Analysis of bi-metal thermostats
-
Timoshenko S. Analysis of bi-metal thermostats. J. Opt. Soc. Amer. 11:1925;233-255.
-
(1925)
J. Opt. Soc. Amer.
, vol.11
, pp. 233-255
-
-
Timoshenko, S.1
-
6
-
-
0014584255
-
Thermal stresses in composite beams
-
Boley B.A., Testa R.B. Thermal stresses in composite beams. Int. J. Solid Struct. 5:1969;1153-1169.
-
(1969)
Int. J. Solid Struct.
, vol.5
, pp. 1153-1169
-
-
Boley, B.A.1
Testa, R.B.2
-
7
-
-
0017516991
-
Edge effects on thermally induced stresses in composite laminates
-
Wang S.S., Crossman F.W. Edge effects on thermally induced stresses in composite laminates. J. Composite Mater. 11:1977;300-312.
-
(1977)
J. Composite Mater.
, vol.11
, pp. 300-312
-
-
Wang, S.S.1
Crossman, F.W.2
-
8
-
-
0039972857
-
Interlaminar thermoelastic stresses in layered beams
-
Grimado P.B. Interlaminar thermoelastic stresses in layered beams. J. Thermal Stresses. 1:1978;75-86.
-
(1978)
J. Thermal Stresses
, vol.1
, pp. 75-86
-
-
Grimado, P.B.1
-
10
-
-
34250151091
-
Thermal Contact Stresses of Bi-Metal Strip Thermostat
-
Beijing, China: Tsinghua university
-
Chang F.-V. Thermal Contact Stresses of Bi-Metal Strip Thermostat. Appl. Math. J. Mech. 4:1983;363-376 Tsinghua university, Beijing, China.
-
(1983)
Appl. Math. J. Mech.
, vol.4
, pp. 363-376
-
-
Chang, F.-V.1
-
11
-
-
0021619229
-
Effect of interlayers in ceramic-metal joints with thermal expansion mismatch
-
Saganuma K., Okamoto T., Koizumi M. Effect of interlayers in ceramic-metal joints with thermal expansion mismatch. J. Amer. Cer. Soc. 67:1984;C256-C257.
-
(1984)
J. Amer. Cer. Soc.
, vol.67
-
-
Saganuma, K.1
Okamoto, T.2
Koizumi, M.3
-
12
-
-
0021133873
-
An edge problem having no singularity at the corner
-
Blech J.J., Kantor Y. An edge problem having no singularity at the corner. Comput. Struct. 18:1984;609-617.
-
(1984)
Comput. Struct.
, vol.18
, pp. 609-617
-
-
Blech, J.J.1
Kantor, Y.2
-
13
-
-
0024736944
-
Thermal stresses at the edge of a bimetallic thermostat
-
Kuo A.Y. Thermal stresses at the edge of a bimetallic thermostat. ASME J. Appl. Mech. 56:1989;585-589.
-
(1989)
ASME J. Appl. Mech.
, vol.56
, pp. 585-589
-
-
Kuo, A.Y.1
-
16
-
-
0345648156
-
-
W.C. Dash. Phys. Rev. 1536 (A) (1955) 98.
-
(1955)
Phys. Rev.
, vol.1536
, Issue.A
, pp. 98
-
-
W.C., Dash.1
-
17
-
-
0345578440
-
Thermal stress and fracture in shear constrained semiconductor device structures
-
Taylor T.C., Yuan F.L. Thermal stress and fracture in shear constrained semiconductor device structures. International Radio Engineers Trans. Elect. Dev. ED-9:1962;303-308.
-
(1962)
International Radio Engineers Trans. Elect. Dev.
, vol.9
, pp. 303-308
-
-
Taylor, T.C.1
Yuan, F.L.2
-
18
-
-
85024545960
-
Edge-bonded dissimilar orthogonal elastic wedges under normal and shear loadings
-
Bogy D.B. Edge-bonded dissimilar orthogonal elastic wedges under normal and shear loadings. ASME J. Appl. Mech. 35:1968;460-466.
-
(1968)
ASME J. Appl. Mech.
, vol.35
, pp. 460-466
-
-
Bogy, D.B.1
-
19
-
-
0014840458
-
On the problem of edge-bonded elastic quarter-planes loaded at the boundary
-
Bogy D.B. On the problem of edge-bonded elastic quarter-planes loaded at the boundary. Int. J. of Solids Struct. 6:1970;1287-1313.
-
(1970)
Int. J. of Solids Struct.
, vol.6
, pp. 1287-1313
-
-
Bogy, D.B.1
-
20
-
-
0344861750
-
Stress singularities in a two-material wedge
-
Hein V.L., Erdogan F. Stress singularities in a two-material wedge. Int. J. Fracture Mech. 7(3):1971;317-330.
-
(1971)
Int. J. Fracture Mech.
, vol.7
, Issue.3
, pp. 317-330
-
-
Hein, V.L.1
Erdogan, F.2
-
21
-
-
0041159884
-
Stresses and strains in a plate bonded to a substrate: Semiconductor devices
-
Zeyfang R. Stresses and strains in a plate bonded to a substrate: semiconductor devices. Solid State Electron. 14:1971;1035-1039.
-
(1971)
Solid State Electron.
, vol.14
, pp. 1035-1039
-
-
Zeyfang, R.1
-
22
-
-
0015650629
-
Interface stress of Alx Ga1-xAs-GaAs layer structures
-
Reinhart F.K., Logan R.A. Interface stress of Alx Ga1-xAs-GaAs layer structures. J. Appl. Phys. 44(7):1973;3171-3175.
-
(1973)
J. Appl. Phys.
, vol.44
, Issue.7
, pp. 3171-3175
-
-
Reinhart, F.K.1
Logan, R.A.2
-
23
-
-
0016974517
-
Analysis of stress and strain distribution in thin films and substrates
-
Roll K. Analysis of stress and strain distribution in thin films and substrates. J. Appl. Phys. 47(7):1976;3224-3229.
-
(1976)
J. Appl. Phys.
, vol.47
, Issue.7
, pp. 3224-3229
-
-
Roll, K.1
-
24
-
-
0017504881
-
Calculated stresses in multilayered heteroepitaxial structures
-
Olsen G.H., Ettenberg M. Calculated stresses in multilayered heteroepitaxial structures. J. Appl. Phys. 48(6):1997;2543-2547.
-
(1997)
J. Appl. Phys.
, vol.48
, Issue.6
, pp. 2543-2547
-
-
Olsen, G.H.1
Ettenberg, M.2
-
25
-
-
0020098862
-
Simple stress formula for multilayered thin films on a thick substrate
-
Vilms J., Kerps D. Simple stress formula for multilayered thin films on a thick substrate. J. Appl. Phys. 53(3):1982.
-
(1982)
J. Appl. Phys.
, vol.53
, Issue.3
-
-
Vilms, J.1
Kerps, D.2
-
26
-
-
0020902535
-
Structural copper: A pliable high conductance material for bonding to silicon power devices
-
Glascock H.H., Webster H.J. Structural copper. a pliable high conductance material for bonding to silicon power devices IEEE Trans. Components, Hybrids and Manuf. Tech., CHMT-6(4):1984.
-
(1984)
IEEE Trans. Components, Hybrids and Manuf. Tech.
, vol.6
, Issue.4
-
-
Glascock, H.H.1
Webster, H.J.2
-
27
-
-
0040565732
-
Stresses in adhesively bonded bi-material assemblies used in electronic packaging
-
E. Suhir, Stresses in adhesively bonded bi-material assemblies used in electronic packaging, Elect. Pack. Mat. Sci.-II, MRS Symp. Proc.(1986a) 133-138.
-
(1986)
Elect. Pack. Mat. Sci.-II, MRS Symp. Proc.
, pp. 133-138
-
-
Suhir, E.1
-
28
-
-
0022787978
-
Stresses in bi-metal thermostats
-
E. Suhir, Stresses in bi-metal thermostats, Trans, ASME, J. Appl. Mech. 53 (3) (1986b) 657-660.
-
(1986)
Trans, ASME, J. Appl. Mech.
, vol.53
, Issue.3
, pp. 657-660
-
-
Suhir, E.1
-
29
-
-
0022938018
-
Calculated thermally induced stresses in adhesively bonded and soldered assemblies
-
E. Suhir, Calculated thermally induced stresses in adhesively bonded and soldered assemblies, Int. Symp. Microelect. (1986c) 383-392.
-
(1986)
Int. Symp. Microelect.
, pp. 383-392
-
-
Suhir, E.1
-
30
-
-
0024132461
-
An approximate analysis of stresses in multilayered elastic thin films
-
IL, Nov 28-Dec 2, WA/APM-14
-
E. Suhir, An approximate analysis of stresses in multilayered elastic thin films, 1988 ASME Winter Annual Meeting, IL, Nov 28-Dec 2, (1988) WA/APM-14.
-
(1988)
1988 ASME Winter Annual Meeting
-
-
Suhir, E.1
-
31
-
-
0024734854
-
Interfacial stresses in bimetal thermostats
-
Suhir E. Interfacial stresses in bimetal thermostats. ASME J. Appl. Mech. 56:1989;595-600.
-
(1989)
ASME J. Appl. Mech.
, vol.56
, pp. 595-600
-
-
Suhir, E.1
-
33
-
-
0023138354
-
Analysis of end stresses in glass-metal bimaterial strips
-
in: W.E. Moddeman, C.S. Mertem, D.P. Kramer, (Eds.), ASME, MD
-
F.P. Gerstle Jr., R.S. Chambers, Analysis of end stresses in glass-metal bimaterial strips, in: W.E. Moddeman, C.S. Mertem, D.P. Kramer, Technology Og Glass, Ceramic, or Ceramic-Glass to Metal Sealing (Eds.), ASME, MD-vol. 4 pp. 47-59.
-
Technology Og Glass, Ceramic, or Ceramic-Glass to Metal Sealing
, vol.4
, pp. 47-59
-
-
Gerstle F.P., Jr.1
Chambers, R.S.2
-
34
-
-
0026124354
-
Thermal stresses and free-edge effects in laminated beams: A variational approach using stress functions
-
Yin W.L. Thermal stresses and free-edge effects in laminated beams. a variational approach using stress functions J. Electron. Pack. 113:1991;68-75.
-
(1991)
J. Electron. Pack.
, vol.113
, pp. 68-75
-
-
Yin, W.L.1
-
36
-
-
0026377583
-
Thermal stresses in layered electrical assemblies bonded with solder
-
Morgan H.S. Thermal stresses in layered electrical assemblies bonded with solder. J. Electron. Pack. 113:1997;350-354.
-
(1997)
J. Electron. Pack.
, vol.113
, pp. 350-354
-
-
Morgan, H.S.1
-
38
-
-
0026169569
-
Asymptotic expansions for the thermal stresses in bonded semi-infinite bimaterial strips
-
Lee M., Jasiuk I. Asymptotic expansions for the thermal stresses in bonded semi-infinite bimaterial strips. J. Electron. Pack. 113:1991;173-177.
-
(1991)
J. Electron. Pack.
, vol.113
, pp. 173-177
-
-
Lee, M.1
Jasiuk, I.2
-
39
-
-
0030379695
-
A comparison of viscoplastic and plastic constitutive models for Pb/Sn solder Zalloys
-
Basaran C. A comparison of viscoplastic and plastic constitutive models for Pb/Sn solder Zalloys. ASME-EEP Structural Analysis in Microelectronics and Fiber Optics. 16:1996;149-154.
-
(1996)
ASME-EEP Structural Analysis in Microelectronics and Fiber Optics
, vol.16
, pp. 149-154
-
-
Basaran, C.1
-
40
-
-
0031382724
-
Finite element simulation of the temperature cycling tests
-
Basaran C., Chandaroy R. Finite element simulation of the temperature cycling tests. IEEE Comp. Pack. Man. Tech. Part A. 20(4):1997;530-536.
-
(1997)
IEEE Comp. Pack. Man. Tech. Part a
, vol.20
, Issue.4
, pp. 530-536
-
-
Basaran, C.1
Chandaroy, R.2
-
41
-
-
0003334271
-
Constitutive modeling using the disturbed state as microstructure self-adjustment concept
-
H.B. Muhlhaus. Chichester, UK: Wiley. (chapter 8)
-
Desai C.S. Constitutive modeling using the disturbed state as microstructure self-adjustment concept. Muhlhaus H.B. Continuum Models for Materials with Microstructure. 1995;Wiley, Chichester, UK. (chapter 8).
-
(1995)
Continuum Models for Materials with Microstructure
-
-
Desai, C.S.1
-
42
-
-
0030151705
-
Disturbed state constituive modeling based on stress-strain and non-destructive behavior
-
Desai C.S., Toth J. Disturbed state constituive modeling based on stress-strain and non-destructive behavior. Int. J. Solids Struct. 33(11):1996;1619-1650.
-
(1996)
Int. J. Solids Struct.
, vol.33
, Issue.11
, pp. 1619-1650
-
-
Desai, C.S.1
Toth, J.2
-
43
-
-
0031342784
-
-
Desai C.S., Chia J., Kundu T., Prince J. Thermomechanical response of materials and interfaces in electronic packaging. Part I - unified constitutive model and calibration 119(4):1997;294-300.
-
(1997)
Thermomechanical Response of Materials and Interfaces in Electronic Packaging: Part I - Unified Constitutive Model and Calibration
, vol.119
, Issue.4
, pp. 294-300
-
-
Desai, C.S.1
Chia, J.2
Kundu, T.3
Prince, J.4
-
44
-
-
0032027467
-
Thermomechanical finite element analysis of problems using the disturbed state concept: Part 1 - theory and formulation
-
Basaran C., Desai C.S., Kundu T. Thermomechanical finite element analysis of problems using the disturbed state concept. part 1 - theory and formulation J. Electron. Pack. 120:1998;41-47.
-
(1998)
J. Electron. Pack.
, vol.120
, pp. 41-47
-
-
Basaran, C.1
Desai, C.S.2
Kundu, T.3
-
47
-
-
0032292877
-
A thermodynamic framework for damage mechanics of solder joints, Trans. ASME
-
Basaran C., Yan C. A thermodynamic framework for damage mechanics of solder joints, Trans. ASME. J. Electron. Pack. ASME J. Electron. Pack. 120:1998;379-384.
-
(1998)
J. Electron. Pack. ASME J. Electron. Pack.
, vol.120
, pp. 379-384
-
-
Basaran, C.1
Yan, C.2
-
48
-
-
0040482168
-
-
Wiley, New York, NY
-
D. Halliday, R. Resnick, Physics, Wiley, New York, NY, 1966.
-
(1966)
Physics
-
-
Halliday, D.1
Resnick, R.2
|