Photoelectron spectroscopy at clean and hydrogenated c(2 × 2)-SiC(100) surfaces

Applied Surface Science

Volumn 123-124, Issue , 1998, Pages 17-21

  Tautz, F S ^a   Sloboshanin, S ^a   Hohenecker, S ^b   Zahn, D R T ^b   Schaefer, J A ^a  

^a ILMENAU UNIVERSITY OF TECHNOLOGY   (Germany)

^b CHEMNITZ UNIVERSITY OF TECHNOLOGY   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

HYDROGEN; HYDROGENATION; LOW ENERGY ELECTRON DIFFRACTION; SURFACE STRUCTURE; SURFACE TREATMENT; X RAY PHOTOELECTRON SPECTROSCOPY;

SURFACE RECONSTRUCTION;

SILICON CARBIDE;

EID: 4243456660     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(97)00531-X     Document Type: Article

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