Dispersive Raman microscopy

Analusis

Volumn 28, Issue 1, 2000, Pages 3-10

  Boyer, H ^a   Oswalt, J ^a  

^a HORIBA LTD   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ARTICLE; CONFOCAL MICROSCOPY; IMAGING SYSTEM; LASER; MICROANALYSIS; RAMAN SPECTROMETRY; SPECTRAL SENSITIVITY;

EID: 0034097215     PISSN: 03654877     EISSN: None     Source Type: Journal    
DOI: 10.1051/analusis:2000280003     Document Type: Article

References (17)

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