Raman microprobe study of silicon-infiltrated silicon carbide

Applied Spectroscopy

Volumn 52, Issue 9, 1998, Pages 1252-1254

  Panitz, Jan Christoph ^a   Wokaun, Alexander ^a  

^a PAUL SCHERRER INSTITUTE   (Switzerland)

Author keywords

Composite ceramic materials; Raman spectroscopy; Silicon, Silicon carbide

Indexed keywords

CERAMIC MATERIALS; COMPOSITE MATERIALS; INFILTRATION; LIGHT POLARIZATION; RAMAN SPECTROSCOPY; REFRACTIVE INDEX; SILICON;

BREIT-WIGNER-FANO PROFILES; LINE SHAPE ANALYSIS; RAMAN MICROPROBE SPECTROSCOPY;

SILICON CARBIDE;

EID: 0032157075     PISSN: 00037028     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (9)

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