Digital radiography with a large-area, amorphous-silicon, flat-panel x- ray detector system

Investigative Radiology

Volumn 35, Issue 4, 2000, Pages 260-266

  Spahn, Martin ^a   Strotzer, Michael ^b   Völk, Markus ^b   Böhm, Stefan ^a   Geiger, Bernhard ^a   Hahm, Gerhard ^a   Feuerbach, Stefan ^b  

^a SIEMENS AG   (Germany)

^b UNIVERSITY HOSPITAL REGENSBURG   (Germany)

Author keywords

Amorphous silicon; Detective quantum efficiency; Digital radiography; Flat panel detector

Indexed keywords

SILICON DIOXIDE;

ARTICLE; DIGITAL RADIOGRAPHY; IMAGE ANALYSIS; IMAGE DISPLAY; IMAGE QUALITY; PRIORITY JOURNAL;

EID: 0034051282     PISSN: 00209996     EISSN: None     Source Type: Journal    
DOI: 10.1097/00004424-200004000-00007     Document Type: Article

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