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Volumn 12, Issue 4, 2000, Pages 285-288

Fabrication of a sexithiophene semiconducting wire: Nanoshaving with an atomic force microscope tip

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CHARGE CARRIERS; CURRENT VOLTAGE CHARACTERISTICS; PHOTOCONDUCTIVITY; SEMICONDUCTING ORGANIC COMPOUNDS; SULFUR COMPOUNDS;

EID: 0033903037     PISSN: 09359648     EISSN: None     Source Type: Journal    
DOI: 10.1002/(SICI)1521-4095(200002)12:4<285::AID-ADMA285>3.0.CO;2-D     Document Type: Article
Times cited : (14)

References (36)
  • 30
    • 0031072324 scopus 로고    scopus 로고
    • Other scanning probe methods have been used to pattern organic semiconductors for devices. See for example a) K. Isobe, T. Fukunaga, W. Takashima, K. Kaneto, Synth. Met. 1997, 85, 1435.
    • (1997) Synth. Met. , vol.85 , pp. 1435
    • Isobe, K.1    Fukunaga, T.2    Takashima, W.3    Kaneto, K.4
  • 33
    • 0343075217 scopus 로고    scopus 로고
    • note
    • While we were able to obtain I-V characteristics for the wire in Figure 1B, a short to the gate electrode prevented characterization of the device in Figure 1D. Consequently, all of the data in this work correspond to Figure 1B.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.