Watching chips work: Picosecond hot electron light emission from integrated circuits

Journal of Crystal Growth

Volumn 210, Issue 1, 2000, Pages 318-322

  Kash, J A ^a   Tsang, J C ^a  

^a IBM T J WATSON RESEARCH CENTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CMOS INTEGRATED CIRCUITS; ELECTRIC NETWORK ANALYSIS; ELECTRON EMISSION; HOT CARRIERS; LUMINESCENCE OF SOLIDS; MICROPROCESSOR CHIPS; OSCILLATORS (ELECTRONIC);

EMISSION PULSES; PICOSECOND INTEGRATED CIRCUIT ANALYSIS (PICA);

FIELD EFFECT TRANSISTORS;

EID: 0033896048     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-0248(99)00704-6     Document Type: Article

References (4)

1. Tsang J.C., Kash J.A. Appl. Phys. Lett. 70:1997;889.
2. Kash J.A., Tsang J.C. IEEE Electron. Dev. Lett. 18:1997;330.
3. J.A. Kash, J.C. Tsang, D.R. Knebel, D.P. Vallett, Proceedings of the 24th International Symposium for Testing and Failure Analysis, 1998, p. 483.
4. D.R. Knebel, P.N. Sanda, M. McManus, J.A. Kash, J.C. Tsang, D.P. Vallett, L. Huisman, P. Nigh, R. Rizzolo, P. Song, F. Motika, Proceedings of the International Test Conference, 1998, p. 733.