|
Volumn 27, Issue 4, 1999, Pages 185-193
|
Growth of thin Ti films on Al single-crystal surfaces at room temperature
a a a a a |
Author keywords
[No Author keywords available]
|
Indexed keywords
ALUMINUM;
EPITAXIAL GROWTH;
FILM GROWTH;
LOW ENERGY ELECTRON DIFFRACTION;
MONOLAYERS;
PHOTOEMISSION;
RUTHERFORD BACKSCATTERING SPECTROSCOPY;
SINGLE CRYSTALS;
THIN FILMS;
TITANIUM;
X RAY PHOTOELECTRON SPECTROSCOPY;
LOW ENERGY ION SCATTERING (LEIS);
STRANSKI-KRASTANOV GROWTH MODE;
METALLIC FILMS;
|
EID: 0032679903
PISSN: 01422421
EISSN: None
Source Type: Journal
DOI: 10.1002/(SICI)1096-9918(199904)27:4<185::AID-SIA467>3.0.CO;2-H Document Type: Article |
Times cited : (8)
|
References (22)
|