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Volumn 439, Issue 2-3, 2000, Pages 293-302
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Forward-bias operation of Si detectors: A way to work in high-radiation environment: On behalf of the ROSE (RD-48) collaboration
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Author keywords
Forward bias operation; Irradiated silicon detectors
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Indexed keywords
ELECTRIC CHARGE;
ELECTRIC CURRENTS;
ELECTRIC POTENTIAL;
NEUTRON IRRADIATION;
SEMICONDUCTING SILICON;
SEMICONDUCTOR DIODES;
THERMAL EFFECTS;
CHARGE COLLECTION EFFICIENCY (CCE);
DARK CURRENTS;
FORWARD-BIASED DETECTORS;
SEMICONDUCTOR DETECTORS;
PARTICLE DETECTORS;
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EID: 0033889932
PISSN: 01689002
EISSN: None
Source Type: Journal
DOI: 10.1016/S0168-9002(99)00840-2 Document Type: Article |
Times cited : (18)
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References (23)
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