Assessment of MgO(1 0 0) and (1 1 1) substrate quality by X-ray diffraction

Journal of Crystal Growth

Volumn 209, Issue 1, 2000, Pages 91-101

  Madsen, Lynnette D ^a   Charavel, Rémy ^a   Birch, Jens ^a   Svedberg, Erik B ^a  

^a LINKÖPING UNIVERSITY   (Sweden)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; PROCESS CONTROL; SUBSTRATES; X RAY CRYSTALLOGRAPHY;

HIGH RESOLUTION X-RAY DIFFRACTION (HRXRD);

MAGNESIA;

EID: 0033883840     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-0248(99)00533-3     Document Type: Article

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