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Volumn 36, Issue 5, 2000, Pages 407-408

Single-electron OR gate

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; COMPUTER SOFTWARE; ELECTRIC NETWORK ANALYSIS; MONTE CARLO METHODS;

EID: 0033880157     PISSN: 00135194     EISSN: None     Source Type: Journal    
DOI: 10.1049/el:20000394     Document Type: Article
Times cited : (24)

References (7)
  • 1
    • 0000889296 scopus 로고
    • A possible explanation of the increase of the electrical resistance of thin metal films at low temperatures and small field strengths
    • GORTER, C.J.: 'A possible explanation of the increase of the electrical resistance of thin metal films at low temperatures and small field strengths', Physica, 1951, 17, pp. 777-780
    • (1951) Physica , vol.17 , pp. 777-780
    • Gorter, C.J.1
  • 2
    • 0031117154 scopus 로고    scopus 로고
    • Aspects of systems and circuits for nanoelectronics
    • GOSER, K.F., PACHA, C., KANSTEIN, A., and ROSSMANN, M.L.: 'Aspects of systems and circuits for nanoelectronics', Proc. IEEE, 1997, 85, pp. 558-573
    • (1997) Proc. IEEE , vol.85 , pp. 558-573
    • Goser, K.F.1    Pacha, C.2    Kanstein, A.3    Rossmann, M.L.4
  • 3
    • 0033116184 scopus 로고    scopus 로고
    • Single-electron devices and their applications
    • LIKHAREV, K.K.: 'Single-electron devices and their applications', Proc. IEEE, 1999, 87, pp. 606-632
    • (1999) Proc. IEEE , vol.87 , pp. 606-632
    • Likharev, K.K.1
  • 5
    • 0029252336 scopus 로고
    • Simple and stable single-electron logic utilizing tunnel junction load
    • FUKUI, H., FUJISHIMA, M., and HOH, K.: 'Simple and stable single-electron logic utilizing tunnel junction load'. Jpn. J. Appl. Phys., 1995, 34, pp. 1345-1350
    • (1995) Jpn. J. Appl. Phys. , vol.34 , pp. 1345-1350
    • Fukui, H.1    Fujishima, M.2    Hoh, K.3
  • 6
    • 0031177646 scopus 로고    scopus 로고
    • Single-electron logic device based on the binary decision diagram
    • ASAHI, N., AKAZAWA, M., and AMEMIYA, Y.: 'Single-electron logic device based on the binary decision diagram'. IEEE Trans. Electron Devices, 1997, 44, pp. 1109-1116
    • (1997) IEEE Trans. Electron Devices , vol.44 , pp. 1109-1116
    • Asahi, N.1    Akazawa, M.2    Amemiya, Y.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.