Charge collection efficiency of irradiated silicon detector operated at cryogenic temperatures

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 440, Issue 1, 2000, Pages 5-16

  Borer, K ^a   Janos, S ^a   Palmieri, V G ^a   Dezillie, B ^b   Li, Z ^b   Collins, P ^c   Niinikoski, T O ^c   Lourenco C ^c   Sonderegger, P ^c   Borchi, E ^d   Bruzzi, M ^d   Pirollo, S ^d   Granata, V ^e   Pagano, S ^e,m   Chapuy, S ^f   Dimcovski, Z ^f   Grigoriev, E ^f   Bell, W ^g   Devine, S R H ^g   O'Shea, V ^g   Smith, K ^g   Berglund, P ^h   De Boer, W ⁱ   Hauler, F ⁱ   Heising, S ⁱ   Jungermann, L ⁱ   Casagrande, L ^j   Cindro, V ^k   Mikuz M ^k   Zavartanik, M ^k   Da Via C ^l   Esposito, A ^l   Konorov, I ^l   Paul, S ^l   Schmitt, L ^l   Buontempo, S ^m   D'Ambrosio, N ^m   Ruggiero, G ^m   Eremin, V ⁿ   Verbitskaya, E ⁿ   more..

^a UNIVERSITY OF BERN   (Switzerland)

^b BROOKHAVEN NATIONAL LABORATORY   (United States)

^c CERN   (Switzerland)

^d UNIVERSITY OF FLORENCE   (Italy)

^e CNR   (Italy)

^f UNIVERSITY OF GENEVA   (Switzerland)

^g UNIVERSITY OF GLASGOW   (United Kingdom)

^h AALTO UNIVERSITY   (Finland)

ⁱ UNIVERSITY OF KARLSRUHE   (Germany)

^j LIP   (Portugal)

^k JO EF STEFAN INSTITUTE   (Slovenia)

^l TECHNICAL UNIVERSITY OF MUNICH   (Germany)

^m UNIVERSITY OF NAPLES FEDERICO II   (Italy)

ⁿ IOFFE INSTITUTE   (Russian Federation)

more..

Author keywords

[No Author keywords available]

Indexed keywords

DOSIMETRY; ELECTRIC CURRENTS; ELECTRIC POTENTIAL; IRRADIATION; SILICON SENSORS;

CHARGE COLLECTION EFFICIENCY; LAZARUS EFFECT;

PARTICLE DETECTORS;

EID: 0033874671     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-9002(99)00799-8     Document Type: Article

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