Ambiguity Groups and Testability

IEEE Transactions on Instrumentation and Measurement

Volumn 38, Issue 5, 1989, Pages 941-947

  Stenbakken, Gerard N ^a   Souders, T Michael ^a,b   Stewart, G W ^a  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

^b UNIVERSITY OF MARYLAND   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

MATHEMATICAL TECHNIQUES--ALGORITHMS;

AMBIGUITY GROUPS; ANALOG CIRCUIT TESTING; PERFORMANCE PREDICTION; SENSITIVITY MODELS;

ELECTRONIC CIRCUITS;

EID: 0024750674     PISSN: 00189456     EISSN: 15579662     Source Type: Journal    
DOI: 10.1109/19.39034     Document Type: Article

References (10)

1. G. N. Stenbakken, T. M. Souders, J. A. Lechner, and P. T. Boggs, “Efficient calibration strategies for linear time invariant systems,” in Proc. 1985 IEEE AUTOTESTCON, pp. 361-366, Oct. 1985.
2. T. M. Souders and G. N. Stenbakken, “Modeling and test point selection for data converter testing,” in 1985 IEEE Int. Test Conf. Proc., pp. 813–817, Nov. 1985.
3. G. N. Stenbakken and T. M. Souders, “Test point selection and testability measures via QR factorization of linear models,” IEEE Trans. Instrum. Meas., vol. IM-36, pp. 406-410, June 1987.
4. N. Sen and R. Saeks, “Fault diagnosis for linear system via multifrequency measurements,” IEEE Trans. Circuits Syst., vol. CAS-26, 1979.
5. J. W. Bandler and A. E. Salama, “Fault diagnosis of analog circuits,” Proc. IEEE, vol. 73, Aug. 1985.
6. G. W. Stewart, Introduction to Matrix Computations. New York: Academic, 1974.
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8. J. E. Dennis, Jr. and R. B. Schnabel, Numerical Methods for Unconstrained Optimization and Nonlinear Equations. Englewood Cliffs, NJ: Prentice-Hall, 1983.
9. IEEE Standard for Binary Floating-Point Arithmetic, ANSI/IEEE Standard 754, 1985.
10. Floating-Point Programmers Guide for the Sun Work Station, Sun Microsystems, Inc., Mountain View, CA, Sept. 1986.