Diagnosability of Nonlinear Circuits and Systems -Part I: The dc Case

IEEE Transactions on Circuits and Systems

Volumn 28, Issue 11, 1981, Pages 1093-1102

  Visvanathan, V ^a   Sangiovanni Vincentelli, Alberto ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

Genericity input output model Jacobian local diagnosability nonlinear resistive circuits single fault diagnosability test matrix; Index Terms

Indexed keywords

ANALOG CIRCUITS; FAULT DIAGNOSIS; NONLINEAR CIRCUITS;

ELECTRONIC CIRCUITS;

EID: 0019635998     PISSN: 00984094     EISSN: None     Source Type: Journal    
DOI: 10.1109/TCS.1981.1084927     Document Type: Article

References (23)

1. T. N. Trick, W. Mayeda, and A. A. Sakla, “Calculation of parameter values from node voltage measurements,” IEEE Trans. Circuits Syst., vol. CAS-26, pp. 466–474, July 1979.
2. R. M. Biernacki and J. W. Handler, “Postproduction parameter identification of analog ciruits,” in Proc. IEEE Int. Symp. Circuits Syst., Houston, TX, 1980, pp. 1082–1086.
3. F. M. El-Turky and J. Vlach, “Calculation of element values from node voltage measurements,” in Proc. IEEE Int. Symp. Circuits Syst., Houston, TX, 1980, pp. 170–172.
4. N. Sen and R. Saeks, “Fault diagnosis for linear systems via multifre-quency measurements,” IEEE Trans. Circuits Syst., vol. CAS-26, pp. 457–465, July 1979.
5. R. Saeks, S. P. Singh, and R. Liu, “Fault isolation via components simulation,” IEEE Trans. Circuit Theory, vol. CT-19, pp. 634–640, Nov. 1972.
6. M. N. Ransom and R. Saeks, “Fault isolation via term expansion,” in Proc. 3rd Pittsburgh Symp. Modeling and Simulation, vol. 4, Univ. of Pittsburgh, Pittsburgh, PA, 1973, pp. 224–228.
7. N. Navid and A. N. Willson, Jr., “A theory and an algorithm for analog circuit fault diagnosis, IEEE Trans. Circuits Syst., vol. CAS-26, pp. 440–457, July 1979.
8. R. Liu and V. Visvanathan, “Sequentially linear fault diagnosis: Part I—Theory,” IEEE Trans. Circuits Syst., vol. CAS-26, pp. 490–496, July 1979.
9. T. J. Rothenberg, “Identification in parametric models,” Econometrica, vol. 39, pp. 577–591, May 1971.
10. V. Visvanathan and A. Sangiovanni-Vincentelli, “Fault diagnosis of nonlinear circuits and systems: Part I—The dc case,” Electron Res. Lab., Univ. of California, Berkeley, Memo M81/45.
11. G. D. Hachtel, R. K. Brayton, and F. G. Gustayson, “The sparse tableau approach to network analysis and design,” IEEE Trans. Circuit Theory, vol CT-18, pp. 101-113, 1971.
12. C. W. Ho, A. E. Ruehli, and P. A. Brennan, “The modified nodal approach to network analysis,” IEEE Trans. Circuits Syst., vol. CAS-22, pp. 504–509, June 1975.
13. M. Spivak, Calculus on Manifolds. New York: Benjamin, 1965.
14. R. S. Berkowitz, “Conditions for network element value solvability,” IRE Trans. Circuit Theory, vol. CT-9, pp. 24-29, 1962.
15. W. J. Dejka, “Measurement of testability in device and system design,” in Proc. 20th Midwest Symp. Circuits Syst., Lubbock, TX, Aug. 1977, pp. 39–52.
16. J. Dieudonne, Foundations of Modern Analysis. New York: Academic, 1960.
17. G. G. Roussas, A First Course in Mathematical Statistics. Reading, MA: Addison-Wesley, 1973.
18. E. Polak, “On the global stabilization of locally convergent algorithms for optimization and root finding,” in Proc. 6th IFAC World Cong. Comput. Methods in Contr., Boston, MA, 1975.
19. E. Polak and I. Teodoru, “Newton derived methods for nonlinear equations and inequalities,” in Proc. Math. Progress Symp., Univ. of Wisconsin, Madison, 1974.
20. R. M. Biernacki and J. W. Bandler, “Fault location of analog circuits,” in Proc. IEEE Int. Symp. Circuits Syst., Houston, TX, 1980, pp. 1078–1081.
21. T. N. Trick and R. T. Chien, “A note on single fault detection in positive resistor circuits,” IEEE Trans. Circuits Syst., vol. CAS-25, pp. 46–48, Jan. 1978.
22. H. S. M. Chen and R. Sacks, “A search algorithm for the solution of • the multifrequency fault diagnosis equations,” IEEE Trans. Circuits Syst., vol. CAS-26, pp. 589–594, July 1979.
23. G. H. Golub, V. Klema, and G. W. Stewart, “Rank degeneracy and least squares problems,” Dep. Comput. Sci., Stanford Univ., Stanford, CA, Tech. Rep. TR-456, June 1976.