Diagnosability of Nonlinear Circuits and Systems Part II: Dynamical Systems

IEEE Transactions on Circuits and Systems

Volumn 28, Issue 11, 1981, Pages 1103-1108

  Saeks, Richard ^a   Sangiovanni Vincentelli, Alberto ^b   Visvanathan, V ^b  

^a TEXAS TECH UNIVERSITY   (United States)

^b UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

Adjoint map dynamical systems; Frechet derivative Hilbert space; Index Terms; local diagnosability measure

Indexed keywords

ELECTRONIC CIRCUITS; FAILURE ANALYSIS;

NONLINEAR CIRCUITS;

ELECTRIC NETWORKS, NONLINEAR;

EID: 0019633001     PISSN: 00984094     EISSN: None     Source Type: Journal    
DOI: 10.1109/TCS.1981.1084928     Document Type: Article

References (8)

1. V. Visvanathan and A. Sangiovanni-Vincentelli, “Diagnosability of nonlinear circuits and systems—Part I: The dc case,” this issue, pp. 1093–1102.
2. N. Sen and R. Saeks, “Fault diagnosis for linear systems via multifrequency measurements,” IEEE Trans. Circuits Syst., vol. CAS-26, pp. 457–465, July 1979.
3. V. Visvanathan and A. Sangiovanni-Vincentelli, “Fault diagnosis of nonlinear memoryless systems,” in Proc. IEEE Int. Symp. Circuits Syst., Houston, TX, 1980, pp. 1082–1086.
4. A. E. Taylor and D. C. Lay, Introduction to Functional Analysis, 2nd ed. New York: Wiley, 1980.
5. J. T. Schwartz, Nonlinear Functional Analysis. New York: Gordon and Breach, 1969.
6. P. R. Halmos, Measure Theory. New York: Springer, 1974.
7. J. Dieudonné, Foundations of Modern Analysis. New York: Academic, 1960.
8. G. D. Hachtel, R. K. Brayton, and F. G. Gustavson, “The sparse tableau approach to network analysis and design,” IEEE Trans. Circuit Theory, vol. CT-18, pp. 101-113, 1971.