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Volumn 49, Issue 5, 2000, Pages 651-656
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Beam alignment and related problems of spherical aberration corrected high-resolution TEM images
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Author keywords
Alignment free focal condition; Beam alignment; Contrast transfer function; High resolution transmission electron microscopy; Phase shift; Spherical aberration correction
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Indexed keywords
ABERRATIONS;
ALIGNMENT;
ELECTRON ENERGY LEVELS;
ELECTRONS;
IMAGE RESOLUTION;
LENSES;
SPHERES;
TRANSFER FUNCTIONS;
ABERRATION-CORRECTED;
ALIGNMENT-FREE;
ALIGNMENT-FREE FOCAL CONDITION;
BEAM ALIGNMENTS;
CONTRAST TRANSFER FUNCTION;
DEFOCUS;
FOCAL CONDITIONS;
HIGH-RESOLUTION TRANSMISSION ELECTRON MICROSCOPY;
SPHERICAL ABERRATION CORRECTION;
SPHERICAL ABERRATIONS;
HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY;
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EID: 0033760271
PISSN: 00220744
EISSN: None
Source Type: Journal
DOI: 10.1093/oxfordjournals.jmicro.a023854 Document Type: Article |
Times cited : (3)
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References (18)
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