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Ultramicroscopy

Volumn 72, Issue 1-2, 1998, Pages 31-39

Design of an objective lens pole piece for a transmission electron microscope with a resolution less than 0.1 nm at 200 kV

(2) Tsuno, K a Jefferson, D A b

a JEOL LTD (Japan)

b UNIVERSITY OF CAMBRIDGE (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

ABERRATIONS; MAGNETIC FIELD EFFECTS; NUMERICAL ANALYSIS; OPTICAL RESOLVING POWER; TRANSMISSION ELECTRON MICROSCOPY;

CHROMATIC ABERRATION COEFFICIENT; OBJECTIVE LENS POLE PIECE;

ELECTRON LENSES;

ARTICLE; CALCULATION; MAGNETIC FIELD; THEORY; TRANSMISSION ELECTRON MICROSCOPY;

EID: 0032053710 PISSN: 03043991 EISSN: None Source Type: Journal
DOI: 10.1016/S0304-3991(97)00125-3 Document Type: Article

Times cited : (11)

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