FIRST APPLICATION OF A SPHERICAL-ABERRATION CORRECTED MICROSCOPE MATERIAL SCIENCE

Microscopy and Microanalysis

Volumn 4, Issue , 1998, Pages 384-385

  Kabius, B ^a   Urban, K ^a   Haider, M ^b   Uhlemann, S ^b   Schwan, E ^b   Rose, H ^c  

^a FORSCHUNGSZENTRUM JÜLICH   (Germany)

^b CEOS GmbH   (Germany)

^c Institut fur Angewandte Physik   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 85131367317     PISSN: 14319276     EISSN: 14358115     Source Type: Journal    
DOI: 10.1017/S1431927600022042     Document Type: Article

References (3)

1. O. Scherzer, J. Appl. Phys. 20 (1949) 20.
2. H. Rose, Optik 85, (1990) 19 - 24.
3. M. Haider, H. Rose, S. Uhlemann, E. Schwan., B. Kabius, K. Urban, Nature (1998) in press.