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Volumn 41, Issue 1, 2000, Pages 325-326

Patterning of hyperbranched resist materials by electron-beam lithography

Author keywords

[No Author keywords available]

Indexed keywords

ADHESION; CARBONATES; ELECTRON BEAM LITHOGRAPHY; MOLECULAR STRUCTURE; POLYESTERS;

EID: 0033751183     PISSN: 00323934     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article
Times cited : (9)

References (14)
  • 3
  • 6
    • 0041913062 scopus 로고    scopus 로고
    • Micro- and Nanopatterning Polymers; Ito, H., Reichmanis, E., Nalamasu, O., Ueno, T., Eds.; American Chemical Society: Washinton, D C.
    • a) Haba, O.; Takahashi, D.; Haga, K.; Sakai, Y., Nakayaina, T.; Ueda, M. In Micro- and Nanopatterning Polymers; Ito, H., Reichmanis, E., Nalamasu, O., Ueno, T., Eds.; ACS Symp. Ser. 709 American Chemical Society: Washinton, D C., 1999; pp. 237-248.
    • (1999) ACS Symp. Ser. 709 , pp. 237-248
    • Haba, O.1    Takahashi, D.2    Haga, K.3    Sakai, Y.4    Nakayaina, T.5    Ueda, M.6
  • 8
    • 0347246619 scopus 로고    scopus 로고
    • Micro- and Nanopatterning Polymers; Ito, H., Reichmanis, E., Nalamasu, O., Ueno, T., Eds.; American Chemical Society: Washinton, D.C.
    • Barclay, G.G.; King, M.; Orellana, A., Malenfant, P.R.L.; Sinta, R.; Malmstrom, E.; Ito, H ; Hawker, C.J In Micro- and Nanopatterning Polymers; Ito, H., Reichmanis, E., Nalamasu, O., Ueno, T., Eds.; ACS Symp. Ser. 709 American Chemical Society: Washinton, D.C., 1999; pp. 144-160.
    • (1999) ACS Symp. Ser. 709 , pp. 144-160
    • Barclay, G.G.1    King, M.2    Orellana, A.3    Malenfant, P.R.L.4    Sinta, R.5    Malmstrom, E.6    Ito, H.7    Hawker, C.J.8


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.