Deposition and structural characterization of high quality textured C60 thin films

Thin Solid Films

Volumn 368, Issue 1, 2000, Pages 49-54

  Katz, E A ^a   Faiman, D ^a   Shtutina, S ^a   Isakina, A ^b  

^a BEN GURION UNIVERSITY OF THE NEGEV   (Israel)

^b B VERKIN INSTITUTE FOR LOW TEMPERATURE PHYSICS AND ENGINEERING   (Ukraine)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CARBON; DEPOSITION; FULLERENES; PHASE TRANSITIONS; SCANNING TUNNELING MICROSCOPY; X RAY DIFFRACTION;

HIGH QUALITY TEXTURED CARBON THIN FILMS;

THIN FILMS;

EID: 0033751018     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(00)00927-5     Document Type: Article

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